• CN:11-2187/TH
  • ISSN:0577-6686

›› 1999, Vol. 35 ›› Issue (3): 41-43,5.

• 论文 • 上一篇    下一篇

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表面粗糙度提取的小波频谱法

陈庆虎;李柱   

  1. 武汉交通科技大学;华中理工大学
  • 发布日期:1999-05-01

METHOD OF WAVELET FOR PICKING UP SURFACE ROUGHNESS

Chen Qinghu;Li Zhu   

  1. Wuhan Transportation University Huazhong University of Science and Technology
  • Published:1999-05-01

摘要: 提出了表面粗糙度的提取新方法。用小波分析方法确定2维轮廓粗糙度评定基准线和3维表面粗糙度评定基准面,能精确地把表面粗糙度与表面其他成分分离,从而提取表面粗糙度。与传统表面粗糙度提取方法比较,此方法评定精度高,实现方便。

关键词: 表面粗糙度, 评定基准, 小波分析, ces

Abstract: A new method for picking up surface roughness is given. By using wavelets analysis, a reference line for 2-D roughness evaluation and a reference surface for 3-D roughness evaluation can be found and the surface roughness can be separated from other component of the surface precisely. Comparing with the classical methods, the new method is more convenient and more precise for surface roughness evaluation.

Key words: Reference for roughness evaluation, Surface roughness, Wavelets analysis

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