• CN:11-2187/TH
  • ISSN:0577-6686

›› 2004, Vol. 40 ›› Issue (5): 87-91.

• 论文 • 上一篇    下一篇

粗糙表面轮廓相关性的倒谱分析

李成贵   

  1. 北京航空航天大学仪器学院
  • 发布日期:2004-05-15

CEPSTRUM-BASED ANALYSIS METHOD FOR THE AUTO CORRELATION OF ROUGH SURFACE PROFILE

Li Chenggui   

  1. School of Instrument Science and Opto-electrical Engineering, Beijing University of Aeronautics and Astronautics
  • Published:2004-05-15

摘要: 基于倒谱分析的基本原理,认为倒谱反映的是信号和信号延迟之间的内在联系,可应用于粗糙表面轮廓的相关性分析。通过对几种典型机械加工试件测试和倒谱分析,并与以往的统计自相关函数描述方法比较后表明,倒谱同样可以用于随机过程表面的相关性分析,而且能非常容易地判别相关长度,相关性分析的灵敏度比自相关函数高。

关键词: 表面粗糙度, 倒谱分析, 自相关函数

Abstract: Rough surface topography influences a certain number of tribological phenomena like contact pressure, adherence, friction, wear and lubrication. Therefore it is very important to describe the character of rough surface profile. The cepstrum analysis is a new signal processing technique in recent years, and is widely applied to analyse the signal and its echo in the areas of earthquake, speech recognition, acoustics et al. A cepstrum-based analysis method is presented for the auto-correlation of rough surface profile. Some experiments of cepstrum analysis on a few kinds of representative machining specimens are made. The results show that the method based on cepstrum can be used to analyse the auto-correlation of random surface profile effectively, and its analysis sensitivity is superior to the conventional auto-correlation function. Furthermore this method has the advantage of identifying the correlation length of the profile exactly and reasonably.

Key words: Auto-correlation function, Cepstrum analysis, Roughness

中图分类号: