• CN:11-2187/TH
  • ISSN:0577-6686

›› 1992, Vol. 28 ›› Issue (2): 62-64.

• 论文 • 上一篇    下一篇

带微处理器的复层厚度测量装置的研制

严仍春;楼敏珠;邓建国;承德兆   

  1. 上海材料研究所;中国船舶工业总公司第十一所
  • 发布日期:1992-03-01

THE DEVELOPMENT OF THE LAYAER THICKNESS MEASURING UNIT SWITH MICRO-PROCESSOR

Yan Renchun;Lou Mingzhu;Deng Jianggou;Cheng Dezhao   

  1. Shanghai Research Institute of Materials Shipbuilding Technology Research Institute
  • Published:1992-03-01

摘要: 本文介绍了用电磁感应方法测量复层厚度的原理、方法、电路结构及探头装置。着重讨论了用微机来实现复层厚度非线性校正的方法。

关键词: 电磁感应, 微处理机, 误差, 校正

Abstract: This paper introduces the principle, measuring ways, a circuit block diagram and probe unit of measuring layer thickness by means of electro-magnetic inducing method. It is mainly discussed to correct non-linearity for layer thickness by the micro-processor.

Key words: 电磁感应, 微处理机, 误差, 校正