• CN:11-2187/TH
  • ISSN:0577-6686

›› 2004, Vol. 40 ›› Issue (9): 67-70.

• 论文 • 上一篇    下一篇

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电子束在MEMS加工中邻近效应的分析与补偿

尹明;张玉林;程建辉   

  1. 山东大学控制科学与工程学院;山东大学机械工程学院
  • 发布日期:2004-09-15

ANALYSIS AND COMPENSATION OF PROXIMITY EFFECT IN MEMS WITH E-BEAM LITHOGRAPHY

Yin Ming;Zhang Yulin;Cheng Jianhui   

  1. School of Control Science and Engineering, Shandong University School of Mechanical Engineering,Shandong University
  • Published:2004-09-15

摘要: 电子束刻蚀后,通过刻蚀改变了薄膜基片中的分子的重量,并导致希望曝光区域和实际曝光区域不一致,这一现象被称为“邻近效应”。利用SDS-3电子束曝光机完成有关邻近效应的试验。加工过程中加速电压为5~ 30 kV,衬底基片为硅和PMMA,使校正后邻近效应参量 减少30%。给出实际完成基片图。

关键词: 畸变, 邻近效应, 微机电系统, 校正, 最优状态

Abstract: E-beam irradiation changes the molecular weight of the resist by inducing chemical changes in the film,which leads to the undesired exposure-area and desired area non-uni- form.This is commonly called as “proximity effect”.The proximity effect in the SDS-3 E-beam lithography system is verified by experiments.All exposures are made with 5~30 kV beam accelerating in Si and PMMA resist.After correction parameter h is of low 30% and giving pictures of experiment.

Key words: Correction, Distortion, MEMS, Optimal state, Proximity effect

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