• CN:11-2187/TH
  • ISSN:0577-6686

机械工程学报 ›› 2026, Vol. 62 ›› Issue (14): 207-219.doi: 10.3901/JME.260749

• 材料科学与工程 • 上一篇    下一篇

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磁控溅射磁场及放电参数对氩离子输运的调控

田庆旭1, 周啸2, 龚鸣宇2, 张鹤霖3, 陈淑英1, 孟范超1   

  1. 1. 烟台大学精准材料高等研究院 烟台 264005;
    2. 上海交通大学材料科学与工程学院 上海 200240;
    3. 烟台大学机电汽车工程学院 烟台 264005
  • 收稿日期:2025-09-01 修回日期:2026-01-05 发布日期:2026-08-29
  • 作者简介:田庆旭,男,2001年出生。主要研究方向为磁控溅射。E-mail:1264691360@qq.com;孟范超(通信作者),男,1986年出生,博士,副教授。主要研究方向为表面技术。E-mail:mengfanchao@ytu.edu.cn
  • 基金资助:
    科学挑战计划基金(TTZT-2-0202)、山东省泰山学者工程专项经费(tsqn202408154)和烟台市省级以上领军人才专项配套经费资助项目。

Magnetic and Discharge Parameter Effects on Argon Ion Transport in Magnetron Sputtering

Tian Qingxu1, Zhou Xiao2, Gong Mingyu2, Zhang Helin3, Chen Shuying1, Meng Fanchao1   

  1. 1. Institute for Advanced Studies in Precision Materials, Yantai University, Yantai 264005;
    2. School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240;
    3. School of Electromechanical and Automotive Engineering, Yantai University, Yantai 264005
  • Received:2025-09-01 Revised:2026-01-05 Published:2026-08-29

摘要: 磁控溅射在薄膜制备中应用广泛,但仍存在靶材刻蚀不均及效率偏低的问题。本研究旨在阐明磁结构、腔体形状与放电参数对氩离子输运的影响机制,为提升溅射均匀性与效率提供依据。基于耦合磁场与等离子场的有限元模型,评估磁极高度配置(内高外低、等高、外高内低)、腔体高径比(0.5~1.5)及放电条件(阳极电压50~200 V、气压6.67~126.66 Pa)对氩离子分布与溅射行为的影响。结果显示,“外高内低”结构强化磁场约束,使离子分布集中、半峰宽降低23%,刻蚀效率提高但靶材利用率下降;高径比由0.5增至1.5时,离子数密度方差下降94.8%,积分强度提高47.3%,靶材利用率与刻蚀效率分别提升约20倍和1.5倍;随阳极电压升高,氩离子产额呈数量级增长,而气压升高使其衰减至约28%。研究明确了磁场梯度、几何约束与放电条件对离子输运的耦合规律,为磁控溅射设备与工艺优化提供理论支撑。

关键词: 磁控溅射, 氩离子分布, 磁场结构, 放电参数, 等离子体输运, 刻蚀均匀性

Abstract: Magnetron sputtering is widely employed in thin-film fabrication, yet issues such as non-uniform target erosion and limited efficiency remain. This study aims to elucidate the influence mechanisms of magnetic configuration, chamber shape, and discharge parameters on argon ion transport, thereby providing a basis for improving sputtering uniformity and efficiency. A finite-element model coupling the magnetic field and plasma field was developed to evaluate the effects of magnetic pole height configurations (inner-magnet-elevated configuration, equal-elevation configuration, and outer-magnet-elevated configuration), chamber height-to-diameter ratios (0.5-1.5), and discharge conditions (anode voltages of 50-200 V and pressures of 6.67-126.66 Pa) on ion distribution and sputtering behavior. The results show that the outer-magnet-elevated configuration enhances magnetic confinement, leading to a more concentrated ion distribution and a 23% reduction in full-width at half-maximum, thereby increasing erosion efficiency while reducing target utilization. As the height-to-diameter ratio increases from 0.5 to 1.5, the variance of ion density decreases by 94.8%, the integral intensity increases by 47.3%, and target utilization and erosion efficiency increase by approximately 20-fold and 1.5-fold, respectively. Increasing the anode voltage yields orders-of-magnitude growth in argon ion production, whereas increasing pressure suppresses it to 28% of the initial level. These findings clarify the coupled regulatory effects of magnetic-field gradients, geometric constraints, and discharge conditions on ion transport, providing theoretical support for the optimization of magnetron sputtering equipment and process design.

Key words: magnetron sputtering, argon ion distribution, magnetic field configuration, discharge parameters, plasma transport, etching uniformity

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