• CN:11-2187/TH
  • ISSN:0577-6686

机械工程学报 ›› 2026, Vol. 62 ›› Issue (13): 410-417.doi: 10.3901/JME.260704

• 制造工艺与装备 • 上一篇    下一篇

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纳米厚度光刻胶多次刮刀涂布工艺分析

李禹泽, 闫英, 何涛, 李涵, 李贺男, 万佳奇, 方子铿, 郭东明   

  1. 大连理工大学高性能精密制造全国重点实验室 大连 116024
  • 收稿日期:2025-07-06 修回日期:2026-02-13 发布日期:2026-08-28
  • 作者简介:李禹泽,男,2001年出生。主要研究方向为薄膜制备。E-mail:liyuze@mail.dlut.edu.cn;闫英(通信作者),女,1987年出生,博士,副教授,博士研究生导师。主要研究方向为超大口径光栅基底高效加工与纳米尺度缺陷无损检测、超大面积纳米级薄膜厚度均匀性高精度控制以及颗粒可控分布光源薄膜制备。E-mail:yanying@dlut.edu.cn
  • 基金资助:
    国家重点研发计划资助项目(2019YFA0709102,2020YFA0714502)。20250706收到初稿,20260213收到修改稿

Nanometer-scale Thickness Photoresist Multiple Blade Coating Process Analysis

LI Yuze, YAN Ying, HE Tao, LI Han, LI Henan, WAN Jiaqi, FANG Zikeng, GUO Dongming   

  1. National Key Laboratory of High Performance Precision Manufacturing, Dalian University of Technology, Dalian 116024
  • Received:2025-07-06 Revised:2026-02-13 Published:2026-08-28

摘要: 纳米级厚度的光刻胶薄膜在微纳米加工领域,尤其是在半导体制造和微电子器件制造中应用广泛。针对光刻胶薄膜的制备方法,刮刀涂布法因其设备结构简单、溶液利用率高、涂布过程可控,且可适用于大尺寸或大长宽比基底而备受关注。然而,在实际刮涂过程中,单次刮涂仍存在膜厚值不理想及厚度不均匀等问题。为此,提出通过多次刮涂来提高涂布质量,并对不同刮涂次数进行单变量对比实验;同时,检测各组实验中光刻胶膜厚及不均匀性,并利用COMSOL软件对多次刮涂过程中膜厚减薄与均匀性提升的过程进行仿真分析。结果表明,光刻胶薄膜厚度随刮涂次数增加呈反比例函数下降,且多次刮涂可进一步提升薄膜均匀性。本研究为优化刮刀涂布制备光刻胶薄膜工艺提供了新的思路。

关键词: 纳米级厚度, 光刻胶薄膜, 多次刮刀涂布

Abstract: Photoresist films with nanometric thickness are widely applied in the field of micro-nanofabrication, particularly in semiconductor manufacturing and microelectronic device fabrication. Among various fabrication methods for photoresist films, the blade-coating technique has attracted considerable attention due to its simple equipment setup, high solution utilization rate, controllable coating process, and suitability for large or high-aspect-ratio substrates. However, single-pass blade-coating often fails to achieve the desired film thickness and uniformity. To address this issue, this study proposes a multiple-pass blade-coating approach to enhance coating quality. A series of single-variable experiments are carried out to compare the film thickness and non-uniformity under different coating passes, and COMSOL simulations are conducted to investigate how film thickness is gradually reduced and uniformity is improved during multiple passes. The results indicate that the photoresist film thickness decreases in an inverse-proportional manner with the increasing number of passes, and multiple-pass blade-coating further enhances film uniformity. This finding provides a novel strategy for optimizing the blade-coating process in photoresist film preparation.

Key words: nanometer thickness, photoresist film, multiple-blade coating

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