长贮环境下高频电连接器接触性能退化规律的研究

doi:10.3901/JME.2025.14.344

机械工程学报 ›› 2025, Vol. 61 ›› Issue (14): 344-351.doi: 10.3901/JME.2025.14.344

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长贮环境下高频电连接器接触性能退化规律的研究

陈文华, 杨定, 陈哲文, 方英春, 钟立强

浙江理工大学机电产品可靠性分析与测试国家地方联合工程研究中心杭州 310018

收稿日期:2024-06-22 修回日期:2025-01-17 出版日期:2025-07-20 发布日期:2025-08-25
作者简介:陈文华，男，1963年出生，博士，教授，博士研究生导师。主要研究方向为可靠性设计、试验及统计分析。E-mail:chenwh@zstu.edu.cn;钟立强(通信作者)，男，1989年出生，博士，讲师。主要研究方向为电连接器接触可靠性、产品性能退化建模、加速寿命试验和加速退化试验。E-mail:zlq001@zstu.edu.cn
基金资助:
国家自然科学基金资助项目(2021C01133)。

Research on Degradation Law of Contact Performance for High-frequency Electrical Connectors in Long-term Storage Environment

CHEN Wenhua, YANG Ding, CHEN Zhewen, FANG Yingchun, ZHONG Liqiang

National and Local Joint Engineering Research Center of Reliability Analysis and Testing for Mechanical and Electrical Products, Zhejiang Sci-Tech University, Hangzhou 310018

Received:2024-06-22 Revised:2025-01-17 Online:2025-07-20 Published:2025-08-25

摘要/Abstract

摘要： 高频电连接器是型号系统中用于实现高频信号传输的基础元件，其接触性能的退化会造成信号衰减和反射等问题。以J599型高频电连接器为研究对象，分析接触件表面接触状态，建立插入损耗计算方法。考虑温度的影响，分析高频电连接器在贮存环境条件下的接触件表面氧化腐蚀物的增长规律，建立接触对的插入损耗退化轨迹模型。以温度为加速应力开展J599型高频电连接器的加速退化试验，结果表明，提高温度可加快接触性能退化，不同应力水平下的接触退化趋势与轨迹模型预测结果一致。建立基于阿伦尼斯模型的双加速方程，外推得到正常贮存环境下的接触性能退化趋势，可用于指导高频电连接器的可靠性设计、评估和使用维护。

关键词: 高频电连接器, 贮存环境, 性能退化模型, 插入损耗

Abstract: High frequency electrical connector is the key component for high frequency signal transmission in weapon equipment system. The degradation of contact performance will cause signal attenuation and reflection. Taking J599 high frequency electrical connector as the research object, the surface state of the contact is analyzed, and the insertion loss calculation method is established. Considering the influence of temperature, the growth law of oxidation corrosion substances in the contact of high frequency electrical connector under the storage environment is analyzed, and the insertion loss degradation trend model of the contact pair is established. The accelerated degradation test of J599 high frequency electrical connector is carried out with temperature as the accelerated stress. The results show that the contact degradation can be accelerated by increasing the temperature, and the contact degradation trend under different stress levels is consistent with the model. The double acceleration equation based on Arrhenius model is established, and the degradation trend of contact performance under normal storage environment is extrapolated, which can be used to guide the reliability design, evaluation, use and maintenance of high frequency electrical connectors.

Key words: high frequency electrical connector, storage environment, performance degradation model, insertion loss

中图分类号:

TB114

陈文华, 杨定, 陈哲文, 方英春, 钟立强. 长贮环境下高频电连接器接触性能退化规律的研究[J]. 机械工程学报, 2025, 61(14): 344-351.

CHEN Wenhua, YANG Ding, CHEN Zhewen, FANG Yingchun, ZHONG Liqiang. Research on Degradation Law of Contact Performance for High-frequency Electrical Connectors in Long-term Storage Environment[J]. Journal of Mechanical Engineering, 2025, 61(14): 344-351.

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长贮环境下高频电连接器接触性能退化规律的研究

Research on Degradation Law of Contact Performance for High-frequency Electrical Connectors in Long-term Storage Environment

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