[1] LUO J, TIAN P, PAN C T, et al. Ultralow secondary electron emission of graphene[J]. ACS nano, 2011, 5(2):1047-1055. [2] PINTO P C, CALATRONI S, NEUPERT H, et al. Carbon coatings with low secondary electron yield[J]. Vacuum, 2013, 98:29-36. [3] VALLGREN C Y, CALATRONI S, PINTO P C, et al. Characterization of carbon coatings with low secondary electron yield[J]. Vacuum, 2012, 98(4):29-36. [4] MONTERO I, AGUILERA L, DAVILA M E, et al. Secondary electron emission under electron bombardment from graphene nanoplatelets[J]. Applied Surface Science, 2014, 291:74-77. [5] RICCARDI P, CUPOLILLO A, PISARRA M, et al. Primary energy dependence of secondary electron emission from graphene adsorbed on Ni (111)[J]. Applied Physics Letters, 2012, 101(18):183102-1-183102-4. [6] 刘学悫. 阴极电子学[M]. 北京:科学出版社, 1980. LIU Xueque. Cathode electronics[M]. Beijing:Science Press, 1980. [7] LIN Y, JOY D C. A new examination of secondary electron yield data[J]. Surface and Interface Analysis, 2005, 37(11):895-900. [8] BAROODY E M. A theory of secondary electron emission from metals[J]. Physical Review, 1950, 78(6):780-787. [9] WIGNER E P, BARDEEN J. Theory of the work functions monovalent metals, Part I:Physical chemistry. Part Ⅱ:Solid state physics[M]. Berlin:Springer, 1997. [10] GONZE X, BEUKEN J M, CARACAS R, et al. First-principles computation of material properties:the ABINIT software project[J]. Computational Materials Science, 2002, 25(3):478-492. [11] GARRITY K F, BENNETT J W, RABE K M, et al. Pseudopotentials for high-throughput DFT calculations[J]. Computational Materials Science, 2014, 81:446-452. [12] BLÖCHL P E. Projector augmented-wave method[J]. Physical Review B, 1994, 50(24):17953-17979. [13] PERDEW J P, WANG Y. Accurate and simple analytic representation of the electron-gas correlation energy[J]. Physical Review B, 1992, 45(23):13244-13249. [14] MONKHORST H J, PACK J D. Special points for Brillouin-zone integrations[J]. Physical Review B, 1976, 13(12):5188-5192. [15] WHETTEN N R, LAPONSKY A B. Secondary electron emission of single crystals of MgO[J]. Journal of Applied Physics, 1957, 28(4):515-516. [16] SEILER H. Secondary electron emission in the scanning electron microscope[J]. Journal of Applied Physics, 1983, 54(11):R1-R18. [17] CIMINO A, PORTA P, VALIGI M. Dependence of the lattice parameter of magnesium oxide on crystallite size[J]. Journal of the American Ceramic Society, 1966, 49(3):152-156. [18] OLIVER P M, WATSON G W, PARKER S C. Molecular-dynamics simulations of nickel oxide surfaces[J]. Physical Review B, 1995, 52(7):5323-5329. [19] LIM J Y, OH J S, KO B D, et al. Work function of MgO single crystals from ion-induced secondary electron emission coefficient[J]. Journal of applied physics, 2003, 94(1):764-769. [20] GREINER M T, HELANDER M G, WANG Z B, et al. Effects of processing conditions on the work function and energy-level alignment of NiO thin films[J]. The Journal of Physical Chemistry C, 2010, 114(46):19777-19781. [21] KIM J H, HWANG J H, SUH J, et al. Work function engineering of single layer graphene by irradiationinduced defects[J]. Applied Physics Letters, 2013, 103(17):171604-1-171604-5. |