• CN:11-2187/TH
  • ISSN:0577-6686

›› 2014, Vol. 50 ›› Issue (20): 54-62.doi: 10.3901/JME.2014.20.054

• 论文 • 上一篇    下一篇

BGA结构无铅微焊点的低周疲劳行为研究

秦红波;李望云;李勋平;张新平   

  1. 华南理工大学材料科学与工程学院 工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室
  • 出版日期:2014-10-20 发布日期:2014-10-20

Research on Low Cycle Fatigue Behavior of BGA Structure Lead-free Solder Joints

QIN Hongbo; LI Wangyun; LI Xunping; ZHANG Xinping   

  • Online:2014-10-20 Published:2014-10-20

摘要: 基于塑性应变能密度概念提出微焊点低周疲劳裂纹萌生、扩展和寿命预测模型,阐明其与连续介质损伤力学的联系,评估应力三轴度对预测模型的影响,并通过试验和数值计算相结合的方法确定出微米尺度球栅阵列(Ball grid array,BGA)结构单颗Sn3.0Ag0.5Cu无铅焊点(高度为500~100 μm,焊盘直径为480 μm)疲劳裂纹萌生和扩展模型中的相关常数。研究结果表明,疲劳裂纹萌生和扩展循环数与每个循环所产生的塑性应变能密度均呈幂函数关系;应力三轴度会影响疲劳裂纹扩展速率,并最终影响焊点的疲劳寿命;应力三轴度与加载方式有关,拉伸载荷下焊点的应力应变行为受异种材料界面和封装结构力学约束作用的影响,应力三轴度随焊点高度降低而明显升高;而剪切载荷作用下焊点中的力学约束十分有限,焊点高度变化对应力三轴度的影响非常小;测得的高度为100 μm焊点的疲劳裂纹扩展相关常数可以很好地用于预测其他不同高度焊点的疲劳寿命,表明所提出的预测模型可以有效地减小由几何结构和体积变化造成的塑性应变能集中现象对焊点疲劳寿命的影响。

关键词: 低周疲劳, 疲劳寿命, 球栅阵列, 损伤力学, 无铅焊点

Abstract: A plastic strain energy density methodology is proposed to evaluate the initiation and propagation of fatigue crack in lead-free solder joints. The relationships among the plastic strain, plastic strain energy, continuum damage mechanics(CDM) and fatigue life are clarified. Crack growth correlation constants for micro-scale ball grid array(BGA) structure solder joints(with standoff height h in the range 100 to 500 μm and a pad diameter 480 μm) are determined by a combination of experimental estimation and numerical calculation. The results show that the cycle numbers of crack initiation and propagation have power function relationship with the plastic strain energy density generated in each fatigue cycle. Crack propagation rate is affected by stress triaxiality, which is dependent on loading modes, i.e., stress triaxiality increases dramatically with decreasing h under tensile load because of the mechanical constraint effect arising from interfaces and package structure, while under shear load the standoff height has very limited effect on stress triaxiality. Furthermore, crack growth correlation constants identified in solder joints with h=100 μm can be well used to predict fatigue life of solder joints with different geometries, indicating that the fatigue life prediction method proposed in this study can effectively prevent the influence of plastic strain energy concentration caused by structural and volume factors on the prediction of fatigue life of BGA structure solder joints.

Key words: ball grid array, damage mechanics, fatigue life, lead-free solder joint, low cycle fatigue

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