• CN：11-2187/TH
• ISSN：0577-6686

›› 2007, Vol. 43 ›› Issue (2): 127-131.

• 论文 •

高精度STM.IPC-205BJ型原子力显微镜的设计

1. 重庆大学自动化学院;湖南文理学院物理与电子科学系;重庆大学数理学院
• 发布日期:2007-02-15

DESIGN OF HIGH RESOLVING CAPABILITY STM.IPC-205BJ TYPE ATOMIC FORCE MICROSCOPE

PENG Guanghan;YANG Xueheng;XIN Hongzheng;LIU Jichun;LI Xu

1. College of Automation, Chongqing University Department of Physics and Electronic Science, Hunan University of Arts and Science College of Mathematics and Science, Chongqing University
• Published:2007-02-15

Abstract: Based on a high resolving capability scanning tunneling microscope and development on hardware and software design, a new-style higher resolving capability and more useful AFM is developed. The principles of operation, components and some applications of the AFM system is resported. And the special design of the lens body and control process and the manufacture and work process of cantilever are introduced in detail. The AFM adopted a new simple and useful cantilever. This model uses an STM to detect the shift of the cantilever and uses four motors and two PZT tubes to enlarge the scanning rage and to enhance the resolution effectively. The AFM’s resolving capability is as follows: transverse: 0.1 nm, vertical: 0.01 nm. Several images given as samples are obtained with the model.