›› 2005, Vol. 41 ›› Issue (4): 75-78.
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王莉;卢秉恒;丁玉成;刘红忠
发布日期:
Wang Li;Lu Bingheng;Ding Yucheng;Liu Hongzhong
Published:
摘要: 为实现压印光刻中套刻对正超高精度的要求,采用基于斜纹结构光栅差动莫尔信号对正技术。利用光电接收器件阵列组合接收光栅产生的莫尔条纹信号,得到x,y方向的对正偏差信号。通过对基本莫尔信号和差动莫尔信号的分析对比,证明了差动莫尔信号具有更好的灵敏度,并在差动模式的基础上采用Chebyshev数字滤波器进行去噪,最终实现±20 nm重复对正精度,达到100 nm压印光刻的对正精度的要求。
关键词: 差动莫尔信号, 超高精度对正, 结构光栅, 压印光刻
Abstract: An ultra-precision alignment technique based on differential moiré technique is presented for room- temperature imprint lithography. The Moiré signal generated by a pair of special slant gratings is detected by a set of photoelectric detec-tors then the detected signals are used to estimate the magnit-udes of misalignment in x, y directions. The test results confo-rmed that differential moiré signal is more sensitive than simple moiré signal. Additionally, a Chebyshev digital filter is adopted in control system to reduce the noise from the differential moiré signals. As a result, the repeatable alignment accuracy can reach ±20 nm and meet the requirement of alignment accuracy for sub-100 nm imprint lithography.
Key words: Differential moiré signal, Grating, Imprint lithography, Ultra-precision alignment
中图分类号:
TH74 TN247
王莉;卢秉恒;丁玉成;刘红忠. 基于差动莫尔信号的超高精度对正系统[J]. , 2005, 41(4): 75-78.
Wang Li;Lu Bingheng;Ding Yucheng;Liu Hongzhong. ULTRA-PRECISION ALIGNMENT BASED ON DIFFERENTIAL MOIRE TECHNIQUE[J]. , 2005, 41(4): 75-78.
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