• CN: 11-2187/TH
  • ISSN: 0577-6686

›› 2004, Vol. 40 ›› Issue (10): 15-18.

• Article • Previous Articles     Next Articles

REDUCTION OF LONG-RANGE FORCE INTERACTION USING AFM CARBON NANOTUBE TIP

Guo Liqiu;Liang Ji;Dong Shen;Zhao Qingliang   

  1. Department of Mechanical Engineering, Tsinghua University Precision Engineering Research Institute, Harbin Institute of Technology
  • Published:2004-10-15

Abstract: High-resolution imaging of the AFM is based on the minimization of the long-range forces between the microscopic tip and the surface. Theoretical analysis shows that the shape and size of tips are main agents influencing long-range force. Si tips and carbon nanotube tips with different shapes and sizes are used to scan the sample surface. Higher resolution images are obtained with carbon nanotube tips than those with Si tips. This result suggests that carbon nanotube tip is ideal in AFM imaging since it could reduce macroscopical long-range force.

Key words: Atomic force microscope, Carbon nanotube, Long-range force, Tips, ICP, Local sample, Rigid registration, Poisson reconstruction

CLC Number: