• CN:11-2187/TH
  • ISSN:0577-6686

机械工程学报 ›› 2018, Vol. 54 ›› Issue (8): 217-222.doi: 10.3901/JME.2018.08.217

• 交叉与前沿 • 上一篇    下一篇

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静电驱动阶梯型微悬臂梁吸合电压分析

朱军华, 苏伟, 刘人怀, 宋芳芳, 黄钦文   

  1. 工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术国家级重点实验室 广州 510610
  • 收稿日期:2017-06-12 修回日期:2017-11-06 出版日期:2018-04-20 发布日期:2018-04-20
  • 通讯作者: 朱军华(通信作者),男,1980年出生,博士、高级工程师。主要研究方向为电子产品可靠性仿真与试验技术,机械产品耐久性仿真与试验技术,元器件机械可靠性设计技术,微小结构模态试验技术。E-mail:zhujh@ceprei.com
  • 作者简介:苏伟,男,1982年出生,博士。主要研究方向为非线性力学。Email:suwei5@126.com;刘人怀,男,1940年出生,中国工程院院士,教授,博士研究生导师。主要研究方向为固体力学,板壳力学与应用,复合材料结构力学与应用,战略管理,旅游工程学;宋芳芳,女,1979年出生,博士,高级工程师。主要研究方向为振动可靠性。Email:songff@ceprei.com;黄钦文,男,1978年出生,博士,高级工程师。主要研究方向为MEMS器件可靠性。Email:971230012@163.com
  • 基金资助:
    国家自然科学基金(51505089)和广东省自然科学基金(2016A030313672)资助项目。

Pull-in Voltage Analysis of Electrostatically Actuated Stepped Micro-cantilever Beam

ZHU Junhua, SU Wei, LIU Renhuai, SONG Fangfang, HUANG Qinwen   

  1. Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory, China CEPREI Laboratory, Guangzhou 510610
  • Received:2017-06-12 Revised:2017-11-06 Online:2018-04-20 Published:2018-04-20

摘要: 针对静电驱动微机电系统(Micro-electro-mechanical system,MEMS)器件中常见的阶梯型微悬臂梁结构,提出一种吸合电压的计算方法。基于欧拉梁理论和修正的偶应力理论,运用能量法推导出吸合电压理论模型。采用试函数与待定系数的积来表示微悬臂梁位移,利用泰勒展开来简化求解过程。通过与有限元结果对比来验证模型的正确有效性,讨论试函数的选取以及泰勒展开阶数的确定,并与传统质量弹簧模型方法进行对比,最后研究其吸合特性。结果表明,泰勒展开阶数取8时截断误差可以忽略,试函数选择阶梯型微悬臂梁位移函数,理论模型预测误差小于5%,预测结果明显优于传统方法。吸合电压随宽度比增加而单调递增,随长度比增加出现先减小后增加的变化现象,可为低驱动电压MEMS器件设计提供参考。该理论模型中考虑了边缘场效应、尺度效应的影响,可应用于微纳米尺度的微悬臂梁的吸合电压预测。

关键词: 边缘场效应, 尺度效应, 阶梯型悬臂梁, 偶应力理论, 吸合电压

Abstract: Aiming at the stepped micro-cantilever beam commonly used in electrostatically actuated micro electromechanical systems (MEMS) devices, a pull-in voltage calculation method is proposed. Based on a modified couple stress theory and Euler theory, the pull-in voltage model is derived by the energy method. The beam deflection is expressed as the product of a trial function and an unknown coefficient, and the solving process is simplified by using Taylor's expansion. The proposed method is validated by comparing with the finite element solutions. Further the selection of trial function and the determination of the Taylor's expansion order are discussed, the pull-in behaviour of stepped beam is investigated, and the comparison with the traditional method is made. The results show that the truncation error can be neglected as setting the Taylor's expansion order to be 8. The prediction error of the proposed model is less than 5% when using its deflection function, and the predicted results are obviously superior to the traditional method. The pull-in voltage monotonously increase with the increase of width ratio, and first decrease and then increase with the increase of length ratio, which can provide information for the design of low actuation voltage of MEMS devices. The proposed model considers the effect of the fringing field and the size-dependence, and can be used to predict the pull-in voltage in micro/nano scale.

Key words: couple stress theory, fringing field, pull-in voltage, size-dependence, stepped cantilever

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