• CN：11-2187/TH
  • ISSN：0577-6686
机械工程学报

›› 2004, Vol. 40 ›› Issue (12): 96-99.

• 论文 • 上一篇    下一篇

结构光三维测量中的亚像素级特征提取与边缘检测

梁治国;徐科;徐金梧;宋强   

  1. 北京科技大学机械工程学院
  • 发布日期:2004-12-15

SUB-PIXEL FEATURE EXTRACTION AND EDGE DETECTION IN 3-D MEASURING USING STRUCTURED LIGHTS

Liang Zhiguo;Xu Ke;Xu Jinwu;Song Qiang   

  1. Mechanical Engineering School,University of Science and Technology Beijing
  • Published:2004-12-15

PDF

210

摘要： 提高采样频率和检测精度是目前结构光三维测量研究中的关键问题。传统的结构光测量主要通过提取光条中心线来求取物体表面轮廓特征。以激光线光源为结构光光源，提出了针对单条线型激光光束的双特征线提取方法，从而使采样频率提高一倍。同时在算法中引入亚像素检测思想，实现对激光光束的亚像素级特征提取，提高了测量精度。对激光光束宽度与物体表面倾角的关系进行分析，利用Lambert漫反射模型，给出了物体表面倾斜时的阈值修正算法，试验结果验证了算法对提高测量精度的有效性。

关键词: Lambert模型, 结构光, 三维测量, 亚像素

Abstract: Improving sampling frequency and measurement accuracy is essential to 3-D measurements based on structured lights. In conventional applications, centerlines of light strips are extracted to represent 3D profiles of surfaces. Linear lasers are used as structured lights, and a new concept of double featuring line extraction of laser beams is presented. In this way, two borders of a laser beam are extracted as two featuring lines, so sampling frequency is doubled. Sub-pixel detection method is introduced to improve measurement accuracy. Relationships of width of laser beams and obliquity of surfaces are studied, and based on Lambert reflection model, an algorithm of threshold modification for different obliquities is presented, which is tested by examinations.

Key words: 3D measurement, Lambert model, Structured light, Sub-pixel

中图分类号: 

版权所有 © 2019 《机械工程学报》编辑部 | 京icp备05055788号-40