COMPUTER AIDED MEASURING METHOD OF MICROSIZE

›› 1995, Vol. 31 ›› Issue (5): 29-33.

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COMPUTER AIDED MEASURING METHOD OF MICROSIZE

Yan Yunhui;Shinichi Sumi

Northeastern university Tohoku National Industrial Research Institute, Sendai, 983, Japan

Published:1995-09-01

Abstract

Abstract: A microscope-TV camera-computer aided measuring system is discussed, and a method of measuring microsize based on the weighted least square regression is proposed. The results of experiment show that the method has a good stability and high precise, and that there is a significant difference between the vertical and horizontal directions because the factors such as the scanning velocity of the camera can affect the values of pixels in CCD, which must be considered in measuring.

Key words: Computer aided measuring, Image process, Pixel, Weighted regression method Binarization

Yan Yunhui;Shinichi Sumi. COMPUTER AIDED MEASURING METHOD OF MICROSIZE[J]. , 1995, 31(5): 29-33.

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