• CN: 11-2187/TH
  • ISSN: 0577-6686

›› 1999, Vol. 35 ›› Issue (3): 41-43,5.

• Article • Previous Articles     Next Articles

METHOD OF WAVELET FOR PICKING UP SURFACE ROUGHNESS

Chen Qinghu;Li Zhu   

  1. Wuhan Transportation University Huazhong University of Science and Technology
  • Published:1999-05-01

Abstract: A new method for picking up surface roughness is given. By using wavelets analysis, a reference line for 2-D roughness evaluation and a reference surface for 3-D roughness evaluation can be found and the surface roughness can be separated from other component of the surface precisely. Comparing with the classical methods, the new method is more convenient and more precise for surface roughness evaluation.

Key words: Reference for roughness evaluation, Surface roughness, Wavelets analysis

CLC Number: