• CN: 11-2187/TH
  • ISSN: 0577-6686

›› 2009, Vol. 45 ›› Issue (6): 14-23.

• Article • Previous Articles     Next Articles

Review of AFM Based Robotic Nanomanipulation

TIAN Xiaojun;WANG Yuechao;DONG Zaili;XI Ning   

  1. State Key Laboratory of Robotics , Shenyang Institute of Automation,Chinese Academy of Sciences Department of Electrical and Computer Engineering, Michigan State University
  • Published:2009-06-15

Abstract: The development of nanomanipulation based on scanning tunnel microscopr and atomic force microscope (AFM) is introduced, and the necessity of robotic nanomanipulation is presented for solving the problems in the nanomanipulation. Then the research development, state and main existing problems of robotic nanomanipulation are analyzed, according to which the structure prototype of AFM based nanomanipulation system is presented, and key technical problems for realizing robotized nanomanpulation is put forward, which provide valuable ideas for further research work on robotic nanomanipulation.

Key words: Atomic force microscope, Information feedback, Nanomanipulation, Probe positioning, Robotization

CLC Number: