• CN:11-2187/TH
  • ISSN:0577-6686
离子束增强沉积Si3N4膜的显微组织结构分析
金祖卿;常明;许守廉;柳襄怀;郑志宏
ANALYSES OF THE MICROSTRUCTURES OF Si3N4 FILM BY ION BEAM ENHANCED DEPOSITION
Jin Zuqing;Chang Ming;Xu Shoulian;Liu Xianghuai;Zheng Shihong
. 1991, (1): 72 -76 .