• CN:11-2187/TH
  • ISSN:0577-6686

机械工程学报 ›› 2026, Vol. 62 ›› Issue (11): 272-285.doi: 10.3901/JME.260595

• 数字化设计与制造 • 上一篇    

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螺栓-螺母连接结构卡滞机理及影响因素研究

李炜昊, 张京东, 廖日东   

  1. 北京理工大学机械与车辆学院 北京 100081
  • 收稿日期:2024-10-27 修回日期:2025-06-06 发布日期:2026-07-29
  • 作者简介:李炜昊,男,1998年出生,博士研究生。主要研究方向为紧固件连接可靠性。E-mail:996572781@qq.com;廖日东(通信作者),男,1972年出生,博士,教授,博士研究生导师。主要研究方向为结构强度及可靠性。E-mail:liaord@bit.edu.cn
  • 基金资助:
    国家自然科学基金重点(U2141217)和技术基础科研(JSZL2022205A001)资助项目。

Study on the Mechanism of Seizure Failure in Bolt Joints and Analysis of its Influencing Factors

LI Weihao, ZHANG Jingdong, LIAO Ridong   

  1. School of Mechanical Engineering, Beijing Institute of Technology, Beijing 100081
  • Received:2024-10-27 Revised:2025-06-06 Published:2026-07-29

摘要: 卡滞(俗称“咬死”)是一种使螺纹紧固件丧失拆卸方便性的故障模式。由于卡滞失效的实验室复现和观测存在一定困难,因此相关的深入研究工作很少。研究针对螺栓-螺母结构的卡滞现象提出了复现实验方法,总结了卡滞出现过程中的内外螺纹塑性变形以及扭矩与预紧力等加载参数的变化规律,发现了卡滞失效的两种典型模式。提出了卡滞寿命的概念,为螺纹副抗卡滞性能提供了评价指标。测定了不同材料、不同螺距和不同润滑状态下的螺栓-螺母结构卡滞寿命曲线,研究了材料、螺距和润滑三种因素对螺纹副抗卡滞性能的影响规律,通过建立螺栓-螺母结构的精细化有限元模型,计算分析了各因素对螺纹副抗卡滞性能影响的作用机理。结果表明,在一定加载条件下螺纹副材料屈服强度越大,卡滞寿命越长;螺纹螺距越小,卡滞寿命越短;润滑剂能够显著提高螺纹副的抗卡滞性能。螺纹塑形变形量与内外螺纹间隙之比过大是导致卡滞出现的重要原因,材料、螺距和润滑状态等其余因素会通过对该比值的影响间接影响螺纹副的卡滞寿命。

关键词: 螺栓-螺母连接, 卡滞失效, 卡滞寿命, 实验研究

Abstract: Seizure is a failure mode that results in threaded fasteners losing their ease of disassembly. Due to the difficulties associated with laboratory replication and observation of seizure failure, there has been limited in-depth research on this topic. A replication experimental methodology for the seizure phenomenon observed in bolt-nut structures is presented in this paper. The plastic deformation of internal and external threads and the variations in loading parameters such as torque and preload during seizure are summarized, and two typical modes of seizure failure are identified. The concept of seizure life is introduced, providing an evaluation criterion for the anti-seizure performance of threaded pairs. Seizure life curves for bolt-nut structures under different materials, pitches, and lubrication conditions are determined. The influences of material, pitch, and lubrication on the anti-seizure performance of threaded pairs are investigated. A refined finite element model of the bolt-nut structure is established to computationally analyze the mechanisms through which these factors affect the anti-seizure performance. The results indicate that, under certain loading conditions, the greater the yield strength of the material used in the threaded pair, the longer the seizure life, the smaller the thread pitch, the shorter the seizure life. Additionally, the anti-seizure performance of the threaded pair is significantly enhanced by lubrication. The excessive ratio of thread plastic deformation to the clearance between internal and external threads is a significant cause of seizure, while other factors such as material, pitch, and lubrication status indirectly influence the seizure life of the thread pair by affecting this ratio.

Key words: bolt-nut connection, seizure failure, seizure life, experimental study

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