• CN:11-2187/TH
  • ISSN:0577-6686

机械工程学报 ›› 2018, Vol. 54 ›› Issue (24): 197-205.doi: 10.3901/JME.2018.24.197

• 交叉与前沿 • 上一篇    下一篇

贮存剖面下电连接器接触性能退化统计建模研究

钟立强1, 陈文华1, 钱萍1, 高亮2, 陈磊磊1, 赵志伟1   

  1. 1. 浙江理工大学机电产品可靠性分析与测试国家地方联合工程研究中心 杭州 310018;
    2. 四川农业大学机电学院 雅安 625014
  • 收稿日期:2018-03-12 修回日期:2018-10-20 出版日期:2018-12-20 发布日期:2018-12-20
  • 通讯作者: 陈文华(通信作者),男,1963年出生,博士,教授,博士研究生导师。主要研究方向为可靠性设计、试验及统计分析。E-mail:chenwh@zstu.edu.cn
  • 作者简介:钟立强,男,1989年出生,博士研究生。主要研究方向为加速退化试验。E-mail:13588207479@163.com
  • 基金资助:
    国家自然科学基金(51275480,51305402)和浙江理工大学研究生创新(YCX16023)资助项目。

Statistical Modeling of Contact Performance Degradation of the Electrical Connectors Under the Storage Profile

ZHONG Liqiang1, CHEN Wenhua1, QIAN Ping1, GAO Liang2, CHEN Leilei1, ZHAO Zhiwei1   

  1. 1. National and Local Joint Engineering Research Center of Reliability Analysis and Testing for Mechanical and Electrical Products, Zhejiang Sci-Tech University, Hangzhou 310018;
    2. College of Mechanical and Electrical Engineering, Sichuan Agricultural University, Ya'an 625014
  • Received:2018-03-12 Revised:2018-10-20 Online:2018-12-20 Published:2018-12-20

摘要: 针对电连接器面向任务剖面时的贮存可靠性评估问题,分析了电连接器在贮存剖面下的贮存应力及相应的接触失效机理,并建立了在温度-插拔应力下的电连接器接触性能退化统计模型;建立了基于接触对表面接触斑点与氧化腐蚀物的随机相遇机制的计算机模拟模型,以计算机模拟结果与试验结果进行比较,验证了所建模型的有效性;为了进一步检验模型,设计了6组对比试验,并对样品接触件的表面进行微观分析,试验结果表明电连接器的性能退化数据服从正态分布且与模拟结果成线性相关关系,另外插拔力对接触件表面造成损伤并加速了退化过程;解决了电连接器在温度-插拔组合应力下的性能退化建模问题,为电连接器面向任务剖面的加速退化试验方案设计及可靠性评估等进一步的研究奠定了基础。

关键词: 电连接器, 可靠性, 统计建模, 性能退化, 贮存寿命

Abstract: Aiming at the reliability assessment problem of electrical connectors in the storage environment with task profiles, the storage stress and the corresponding contact failure mechanism of electrical connectors are analyzed.The contact performance degradation model for electrical connectors under temperature-insertion stress condition is established,and a computer simulation model is established to simulate the stochastic encounter mechanism of contact spot and oxidative corrosion on the surface of connectors. In order to test the model, 6 groups of comparative tests are designed and the surface of samples are micro-analyzed. The test results show that the performance degradation data of electrical connectors is normally distributed and have a linear correlation with the simulation results, in addition, insertion force cause damage to the contact surface and accelerate the degradation progress of electrical connectors. The reliability modeling problem of electrical connectors under the temperature-insertion stress condition is solved, and laid a foundation for the further research on the reliability assessment and the accelerated degradation testing plan for electrical connectors in the storage environment with task profiles.

Key words: degradation, electrical connectors, reliability, statistic model, storage life

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