• CN: 11-2187/TH
  • ISSN: 0577-6686

›› 1992, Vol. 28 ›› Issue (2): 62-64.

• Article • Previous Articles     Next Articles

THE DEVELOPMENT OF THE LAYAER THICKNESS MEASURING UNIT SWITH MICRO-PROCESSOR

Yan Renchun;Lou Mingzhu;Deng Jianggou;Cheng Dezhao   

  1. Shanghai Research Institute of Materials Shipbuilding Technology Research Institute
  • Published:1992-03-01

Abstract: This paper introduces the principle, measuring ways, a circuit block diagram and probe unit of measuring layer thickness by means of electro-magnetic inducing method. It is mainly discussed to correct non-linearity for layer thickness by the micro-processor.

Key words: 电磁感应, 微处理机, 误差, 校正