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CN: 11-2187/TH
ISSN: 0577-6686
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JME College
中文
THE DEVELOPMENT OF THE LAYAER THICKNESS MEASURING UNIT SWITH MICRO-PROCESSOR
Yan Renchun;Lou Mingzhu;Deng Jianggou;Cheng Dezhao
. 1992, (
2
): 62 -64 .
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