Statistical Modeling of Contact Performance Degradation of the Electrical Connectors Under the Storage Profile

doi:10.3901/JME.2018.24.197

Abstract

Abstract: Aiming at the reliability assessment problem of electrical connectors in the storage environment with task profiles, the storage stress and the corresponding contact failure mechanism of electrical connectors are analyzed.The contact performance degradation model for electrical connectors under temperature-insertion stress condition is established,and a computer simulation model is established to simulate the stochastic encounter mechanism of contact spot and oxidative corrosion on the surface of connectors. In order to test the model, 6 groups of comparative tests are designed and the surface of samples are micro-analyzed. The test results show that the performance degradation data of electrical connectors is normally distributed and have a linear correlation with the simulation results, in addition, insertion force cause damage to the contact surface and accelerate the degradation progress of electrical connectors. The reliability modeling problem of electrical connectors under the temperature-insertion stress condition is solved, and laid a foundation for the further research on the reliability assessment and the accelerated degradation testing plan for electrical connectors in the storage environment with task profiles.

Key words: degradation, electrical connectors, reliability, statistic model, storage life

CLC Number:

TB114
V442

ZHONG Liqiang, CHEN Wenhua, QIAN Ping, GAO Liang, CHEN Leilei, ZHAO Zhiwei. Statistical Modeling of Contact Performance Degradation of the Electrical Connectors Under the Storage Profile[J]. Journal of Mechanical Engineering, 2018, 54(24): 197-205.

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