Abstract: The existing accelerated test methods are only applicable to the case of continuous stress, but the discrete stress is very common in actual working conditions of products. In order to expand the application range of accelerated test, it is necessary to incorporate the discrete stress into the category of accelerated stress. The characteristics of continuous stress and discrete stress are compared, and the definitions of two kinds of stress are given. A criterion for calculating discrete stress interval time under different stress levels by acceleration coefficient is proposed, and these two types of stress are integrated. Based on the Wiener process, a product performance degradation model considering continuous-discrete stress is established. A grouped sequential design method for accelerated degradation test is proposed, and the optimal test plan and compromise test plan are obtained by two-objective step optimization method. Ccompared with the traditional test plan,it shows that the designed schemes are better. Taking the storage life evaluation of the electrical connector as an application case, the calculation results show that the storage life of the electrical connector is reduced by about 40% after considering the insertion force, thus verifying the effectiveness of the proposed method.

Key words: accelerated degradation test, continuous stress, discrete stress, test plan, electrical connector