Abstract:

The J599 series electrical connectors which in warehouse storage environment are taken as research objects, after analyzing their structures and failure modes in the storage environment and understanding the failure mechanisms, the contact failure is determine as the main failure mode of the electrical connector in the storage environment, and the contact surface oxide film layer thickening which makes the membrane resistance increase is the main reason causes the contact failure; Combined with the growth of the oxide film, film growth theory of chemical reaction and the structure of contact pairs, the growth law of membrane resistance is described from the microscopic perspective; Based on the electrical connector’s contact resistance degradation path, the changing rule of the degradation rate under temperature stress as well as the contact reliability and performance degradation, the statistical model of the electrical connector’s storage reliability is established; Considering the relationship among the electrical connector contact reliability and material parameters about coating thickness, porosity, contact materials, slotted length of reed and microscopic surface morphology etc., the electrical connector reliability design model is established , and the reliability quantitative design method is proposed.

Key words: design modeling, reliability, electrical connector