• CN: 11-2187/TH
  • ISSN: 0577-6686

›› 2005, Vol. 41 ›› Issue (12): 118-121.

• Article • Previous Articles     Next Articles

BAYESIAN DEMONSTRATION TEST METHOD FOR FAILURE RATE UNDER WEIBULL DISTRIBUTION

Chen Wenhua;Cui Jie;Pan Jun;Zhou Shengjun;Lu Xianbiao   

  1. State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University The 31th Institute of China Aerospace Science & Industry Corp. Zhejiang College of Science and Technology Hangzhou Aerospace Electrical Technology Co., Ltd
  • Published:2005-12-15

Abstract: In order to make sure whether the reliability of products is satisfied with the provided requirements within testing time as short as possible, it is discussed that Bayesian demonstration testing method on the reliability of products whose life is fitted to Weibull distribution, with Gamma distribution as prior distribution and failure rate as demonstration index. Taken aerospace electrical connectors of certain type for example, Bayesian demonstration testing plan of censoring-Ⅰ is made out and evaluated by Monte-Carlo simulation method. Compared with classical demonstration testing method of cen-soring-Ⅰ, the time of the Bayesian demonstration testing is only about 45% of the classical one. Via Monte-Carlo simu-lated evaluation on the testing plan, the result reveals that the value of posterior user’s risk in theory is basically the same as it in fact. So the testing plan can meet the predestinate require-ments of the testing.

Key words: Bayesian demonstration, Failure rate, Weibull distribution

CLC Number: