• CN: 11-2187/TH
  • ISSN: 0577-6686

›› 2005, Vol. 41 ›› Issue (1): 71-76.

• Article • Previous Articles     Next Articles

SUB-PIXEL EDGE DETECTION METHOD FOR SLM COLOR MICROSCOPIC IMAGES

Liu Chong;Xia Zeyi;Pei Wei;Niyokindi Salvator   

  1. Research Center for Micro-system Technology,Dalian University of Technology Key Laboratory for Precision & Non-traditional Machining Technology of Ministry of Education, Dalian University of Technology
  • Published:2005-01-15

Abstract: The great development in micromanipulation technology has exigent request to develop image processing for the microscopic image. According to the characteristic of the SLM color microscopic image in micromanipulation imaging system, a method for edge detection based on wavelet transformation and HIS is proposed. Then, the interested area of the image is interpolated using cubic spline and accurate sub-pixel edges are obtained based on the zero point of first-order derivatives of cubic spline curve. The experiment result shows that this method is effective for SLM color microscopic images with various magnifications. This method can filter noise from SLM color microscopic images effectively and detect satisfactory edge. Moreover, the method is applied to images with simulated noise and real images. The experiment results are given at the end.

Key words: Color microscopic image, Cubic spline, HIS color space, Sub-pixel edge detection, Wavelet transformation

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