›› 1987, Vol. 23 ›› Issue (4): 13-17.
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Hou Wenmei;Qiu Huifu
Published:
Abstract: BT combining an optical phase comparison method with a Zeemaa-laser, a high resolution heterodyne interference measurement system has been established. It can be used for direct measurement of the refractive index of sir The repeatibility of dm/was determined, In the great number of experiments with 5X10-8.
Key words: Grinding equipment, Grinding process, Precision grinding technology oriented to achieve high process efficiency, Research summary, Large and middle-scale optic
Hou Wenmei;Qiu Huifu. THE APPLICATION OF THE HETEODYNE PHASE COMPARING INTERFERENCE IN NANO-MTEER MEASUREMENT[J]. , 1987, 23(4): 13-17.
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