• CN: 11-2187/TH
  • ISSN: 0577-6686

›› 1987, Vol. 23 ›› Issue (4): 13-17.

• Article • Previous Articles     Next Articles

THE APPLICATION OF THE HETEODYNE PHASE COMPARING INTERFERENCE IN NANO-MTEER MEASUREMENT

Hou Wenmei;Qiu Huifu   

  1. The Graduate School Beijing,Shaanxi Institute of Mechanical Engineering
  • Published:1987-09-01

Abstract: BT combining an optical phase comparison method with a Zeemaa-laser, a high resolution heterodyne interference measurement system has been established. It can be used for direct measurement of the refractive index of sir The repeatibility of dm/was determined, In the great number of experiments with 5X10-8.

Key words: Grinding equipment, Grinding process, Precision grinding technology oriented to achieve high process efficiency, Research summary, Large and middle-scale optic