Research on Degradation Law of Contact Performance for High-frequency Electrical Connectors in Long-term Storage Environment

doi:10.3901/JME.2025.14.344

Abstract

Abstract: High frequency electrical connector is the key component for high frequency signal transmission in weapon equipment system. The degradation of contact performance will cause signal attenuation and reflection. Taking J599 high frequency electrical connector as the research object, the surface state of the contact is analyzed, and the insertion loss calculation method is established. Considering the influence of temperature, the growth law of oxidation corrosion substances in the contact of high frequency electrical connector under the storage environment is analyzed, and the insertion loss degradation trend model of the contact pair is established. The accelerated degradation test of J599 high frequency electrical connector is carried out with temperature as the accelerated stress. The results show that the contact degradation can be accelerated by increasing the temperature, and the contact degradation trend under different stress levels is consistent with the model. The double acceleration equation based on Arrhenius model is established, and the degradation trend of contact performance under normal storage environment is extrapolated, which can be used to guide the reliability design, evaluation, use and maintenance of high frequency electrical connectors.

Key words: high frequency electrical connector, storage environment, performance degradation model, insertion loss

CLC Number:

TB114

CHEN Wenhua, YANG Ding, CHEN Zhewen, FANG Yingchun, ZHONG Liqiang. Research on Degradation Law of Contact Performance for High-frequency Electrical Connectors in Long-term Storage Environment[J]. Journal of Mechanical Engineering, 2025, 61(14): 344-351.

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