• CN:11-2187/TH
  • ISSN:0577-6686
基于原子力显微镜的线宽粗糙度测量
李洪波;赵学增
Measurement of Line Width Roughness by Using Atomic Force Microscope
LI Hongbo;ZHAO Xuezeng
. 2008, (8): 227 -232 .