适用于精密复杂零件表面形状的干涉测量光学系统的光线追迹方法
方素平;小森雅晴;久保爱三;梅雪松
Ray Tracing Method for Optical System of Interferometry Measurement Used for Form Deviation of Precise Complex Surface of Machine Parts
FANG Suping;KOMORI Masaharu;KUBO Aizoh;MEI Xuesong
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2009, (2): 170
-177
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