• CN:11-2187/TH
  • ISSN:0577-6686
亚纳米精度长度溯源计量型动态模式原子力显微镜
黄强先;権太聪;三隅伊知子;黑澤富藏
Length-traceable Nanometrological Dynamic Mode AFM with Sub-nano Accuracy
HUANG Qiangxian;GONDA Satoshi;MISUMI Ichiko;KUROSAWA Tomizzo
. 2008, (3): 195 -199 .