• CN:11-2187/TH
  • ISSN:0577-6686
金属薄膜导线的亚微米局域电导率精确测量技术
吴蕾;葛耀峥;居冰峰
Methodology for Measurement of Submicron Metallic Wire’s Local Electrical Conductivity by Applying Four-points AFM Probe Technique
WU Lei;GE Yaozheng;JU Bingfeng
. 2011, (4): 1 -6 .