›› 2009, Vol. 45 ›› Issue (8): 130-136.
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CHEN Xun;ZHANG Chunhua
Published:
Abstract: High-reliability and long-lifespan issue has become the development goal and pressing requirement for equipment, especially for major equipment and project. The traditional reliability technique is facing a new challenge. As an effective means to ensure high reliability and long lifespan of equipment, the accelerated testing technology becomes a hot spot of research. Based on the analysis of the application requirements, a technical architecture of accelerated testing is brought forward, the current state of researches and applications of accelerated testing is summarized and analyzed, and the strategy for the further development of accelerated testing in China is discussed.
Key words: Accelerated degradation testing, Accelerated life testing, Accelerated testing, High-reliability and long-lifespan, Reliability enhancement testing
CLC Number:
TB114.3
CHEN Xun;ZHANG Chunhua. Research, Application and Development of Accelerated Testing[J]. , 2009, 45(8): 130-136.
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