• CN:11-2187/TH
  • ISSN:0577-6686

机械工程学报 ›› 2022, Vol. 58 ›› Issue (10): 235-244.doi: 10.3901/JME.2022.10.235

• 运载工程 • 上一篇    下一篇

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温度和电压因素对超级电容性能衰退的影响机制及其老化建模研究

黄文豪, 王军, 熊瑞, 陈欢, 王春   

  1. 北京理工大学机械与车辆学院 北京 100081
  • 收稿日期:2021-06-21 修回日期:2021-10-25 出版日期:2022-05-20 发布日期:2022-07-07
  • 通讯作者: 熊瑞(通信作者),男,1985年出生,教授,博士研究生导师,IETFellow。主要研究方向为电动载运工具与电化学储能系统。E-mail:rxiong@bit.edu.cn
  • 作者简介:黄文豪,男,1997年出生。主要研究方向为多电源系统能量管理与超级电容寿命预测。E-mail:3120190333@bit.edu.cn;王军,男,1968年出生,副教授,硕士研究生导师。主要研究方向为车辆动力学。E-mail:wangjunbit@bit.edu.cn
  • 基金资助:
    国家自然科学基金资助项目(51877009 51922006)。

Research on Performance Degradation and Modeling of Supercapacitors Considering the Effects of Temperature and Voltage

HUANG Wenhao, WANG Jun, XIONG Rui, CHEN Huan, WANG Chun   

  1. School of Mechanical Engineering, Beijing Institute of Technology, Beijing 100081
  • Received:2021-06-21 Revised:2021-10-25 Online:2022-05-20 Published:2022-07-07

摘要: 具有卓越高比功率特性的超级电容在电动载运工具上备受青睐,开展性能退化机理分析和建模对其高效可靠地工作具有重要意义。为获得全面的老化数据且提升模型的适应性,选用两款超级电容进行不同温度和截止电压条件下的加速老化试验,试验表明温度和截止电压均会影响电容的衰退性能,其中提升截止电压会显著加速内阻增长。为表征超级电容的容量衰退特性和内阻变化规律,采用Box-Cox变换技术将超级电容容量衰退数据转换为线性衰退轨迹以构建线性老化模型,然后应用Arrhenius定律建立数据驱动的超级电容容量和内阻的衰退预测模型。针对不同截止电压和老化状态下超级电容容量衰退差异的问题,构建了全寿命周期的比例系数函数。试验与仿真结果表明,容量衰退轨迹的预测误差在5%以内,内阻变化轨迹的预测误差在10%以内。

关键词: 超级电容, 性能衰退, 寿命加速试验, 寿命模型, Box-Cox变换

Abstract: Supercapacitor with excellent high specific power characteristics is popular in electric transport equipment. It is important to analyze and model the performance degradation mechanism for its high efficiency and reliability. In order to obtain comprehensive aging data and improve the adaptability of model, two types of supercapacitors were selected for accelerated aging experiments under different temperatures and cut-off voltages. The results show that both temperature and cut-off voltage can affect their degradation performance. The increase of cut-off voltage will significantly accelerate the growth of internal resistance. To describe the capacity degradation characteristics and internal resistance variation law, Box-Cox transformation was used to convert the capacity degradation data into a linear decay trajectory and build a linear aging model. Then, the data-driven degradation prediction model of supercapacitor capacity and internal resistance was established with Arrhenius law. Under different aging states and cut-off voltages, the proportional coefficient functions of the full life cycle were constructed to solve the problem of supercapacitors’ capacity degradation difference. The test and simulation results show that the prediction error of capacity degradation trajectory is less than 5%, and the prediction error of the internal resistance change trajectory is less than 10%.

Key words: supercapacitor, performance degradation, accelerated aging test, life model, Box-Cox transformation

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